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Tender description :
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Tenders are invited for Supply and installation of an electronic scanning microscope with FIB (Focused Ion Beam), X -ray analysis system and mass ablation system of material by clustered laser, destined for the Institute of Microelectronics of Seville of the State Agency Higher Council for Scientific Research.
As indicated in the justification memory of the technical specifications, in the justification memory of the need to hire, and in the specifications of technical prescriptions.
Estimated value excluding VAT:1 700 000,00EUR
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